For many applications from education and routine analysis to high level research including optimized systems for materials analysis, such as characterization & identification, film thickness, gas analysis, microscope imaging, step-scan and dedicated semiconductor research.
The JASCO FT/IR-4000 and FT/IR-6000 Series redefine the application of this powerful, easy-to-use technique. Each compact model offers reliable operation with the highest signal-to-noise ratio in the industry. All instruments feature a highly stable, corner-cube interferometer and AccuTrac™ DSP technology enabling rapid and accurate tracking of mirror position and velocity for optimum signal-to-noise performance.
Our FT-IR Series includes the powerful and intuitive integrated search software solution, the KnowItAll® database Search software package from Sadtler.
Corner cube mirrors automatically correct for any light path deviation, providing excellent optical stability at all times.
The interferometer is manufactured as a solid cast aluminum block and is completely sealed. The FT/IR-4000 uses a 45 deg Michelson interferometer and the FT/IR-6000 uses a 28 degree Michelson interferometer. A near frictionless bearing (without the need for a gas supply) supports the moving mirror which is driven by a ‘voice coil’ for accurate vibration free movement. Laser tracking of the moving mirror is made using Accutrac™ with the latest in digital signal processing. The standard KRS-5 windows prevent hygroscopic damage often seen with KBr windows used on some products.
All models include a fully sealed and desiccated interferometer chamber. In addition, an integrated purge for the optical system is included as standard.
The highly stable interferometer with high intensity two-stage light source offers optimum signal-to-noise performance starting at 28,000:1 and up to 55,000:1 (under standardized conditions).
A highly sensitive and stable DLATGS detector is standard for all instruments. The DLATGS detector element is temperature-controlled using the Peltier effect.
Many optional detectors cover the range from 25,000 to 5 cm-1 and include several LN2 cooled MCT detectors for wide, narrow and mid band, Other include SiPD, InGaAs, Bolometer, etc.
The working range can be extended from the visible to far-IR by switching various optical components, such as source, windows, beam splitter and detector.
A specially designed vibration-proof mounting of the optical bench completely eliminates interference from external vibrations.
For laboratories compliant with GxP regulations, an instrument validation routine is provided as standard to verify instrument performance compliant with ASTM, EP, and JP procedures.
The Start Button on the instrument allows immediate start of sample measurements with a single push of the button. This is a convenient alternative to keyboard and mouse operation when starting data measurement.
A sequence of operations, including data processing, can be defined in the instrument control software, the operational sequence initiated by a simple press of the Start button. No fumbling for the mouse or multiple clicks to obtain a final FT-IR spectrum!
Automatic recognition of sampling accessory is made when it is fitted into the sample compartment. It can also be used to load measurement parameters matched to the accessory; this ensures that data is acquired using the correct parameters.
The Rapid Scan function is optional for the FT/IR-4600, FT/IR-4700, FT/IR-6600, and FT/IR-6700 and provided as a standard feature for the FT/IR-6800. Rapid Scan can be used for fast spectral acquisition using interval analysis.
Several Step Scan options are available for the FT/IR-6000 Series. These include microsecond and nanosecond TRS, phase modulation and amplitude modulation.
The Sadtler search software package, “KnowItAll™ Informatics System, JASCO Edition” with a library of 10,000 chemical and polymer spectra is standard.
All FTIR optical benches are fitted with multi-zone nitrogen purge. The FT/IR-6000 Series can be fitted with several vacuum options. This can be configured from full vacuum or with vacuum interferometer and detector compartments and with the sample chamber nitrogen purged.
The IRT-1000, 5000 or 7000 infrared microscope models can be easily interfaced to any FT/IR-4000 or FT/IR-6000 instrument.
Click on the FTIR applications below for more information