The FP-8000 Series of fluorescence spectrofluorometers features aberration free optical systems and incorporates high intensity continuous xenon sources for unsurpassed sensitivity. A wide range of accessories and software applications support comprehensive measurement and experimental design for both routine measurement and advanced materials research and biochemical analysis.
There are four distinct models in the FP-8000 Series, each offers an optimized solution for fluorescence and phosphorescence applications.
FP-8200 : For general use, especially for routine fluorescence analysis
FP-8300 : Versatile model with additional features for Bio applications
FP-8500 : Research model offering the ultimate performance
FP-8600 : Extended range NIR model for materials analysis research
The high throughput optical system and low noise signal processing of the FP-8000 Series provides users with a high S/N (signal-to-noise) performance of up to 5,000:1 (RMS). The advanced A/D converter enables rapid sampling and the high speed signal processing system that immediately converts the fluorescence signal from the detector to a digital signal without introducing any additional noise.
A wide dynamic range for luminescence measurements is obtained by using the Auto-Gain and Auto-SCS features, automatically adjusting the detector gain and sensitivity for optimum measurements.
Auto-Gain automatically adjusts the gain of a signal from the detector, so that the S/N is optimized throughout the entire scan range for spectral or time course measurements. Since quantum yield measurements can produce peaks that vary greatly in fluorescence intensity, the auto-gain function assures the accuracy of the measurement.
The Auto Sensitivity Control System (SCS) allows users to create calibration curves for a wide concentration range without having to manually change the instrument Sensitivity settings. Auto-SCS can obtain measurements of sub-picomolar to micromolar concentrations for fixed wavelength measurements and quantitative analyses.
The conventional method for removing higher-order diffraction artifacts from excitation/emission spectra involves selection and installation of the proper cut filters according to the scanning wavelengths. The automatic cut filter system of the FP-8000 series (option for FP-8200) selects the proper cut-off filters for spectral measurements to obtain spectra without higher-order diffraction interference.
3D spectra measurement is available for all models of the FP-8000 series. The fastest scan speed of 60,000 nm/min for the FP-8500 offers 3D spectral measurement in the shortest time available for any instrument in this class. The analysis software offers a variety of processing methods to easily display the relevant data characteristics.
A high-speed chopper included with the FP-8300, 8500 and 8600 instruments enables phosphorescence spectrum measurements as well as advanced phosphorescent lifetime and quantitative analysis measurements.
Our comprehensive selection of over 50 sampling accessories for gas, liquid and solid samples ensures optimal performance across many sampling applications.
IQ accessory recognition uses a non-contact RFID sensor for automatic recognition by the instrument. Accessory information, including accessory name and serial number, is retrieved and saved in the spectral data file. The IQ Start function is used to automatically select a specified control program for simplified sample measurements.
A wide variety of accessories and control/analysis programs are available to integrate analysis methods for various samples and application requirements, ranging from biochemical/bioscience to materials research and beyond.
| Model | FP-8200 | FP-8300 | FP-8500 | FP-8600 |
|---|---|---|---|---|
| Light Source | Continuous output Xe arc lamp with shielded lamp housing (150 W) | |||
| Light Source (for validation) | Integrated, selectable low pressure mercury lamp | |||
| Photometric System | Radio-photometer system using monochromatic light to monitor the intensity output of the Xe lamp | |||
| Monochromator | Holographic concave grating in modified Rowland mount | |||
| Wavelength Range (with Standard Detector) | ||||
| Ex | Zero order, 200 - 750 nm | Zero order, 200 - 750 nm | Zero order, 200 - 850 nm | |
| Em | Zero order, 200 - 750 n | Zero order, 200 - 750 nm | Zero order, 200 - 1010 nm | |
| Wavelength Range (Optional) | Zero order, 200 - 900 nm | Zero order, 200 - 900 nm | Zero order, 200 - 850 nm | N/A |
| Automatic Cut Filters for High Order Diffraction | Option | Standard | ||
| Peak Sensitivity | 380:1 | 680:1 | 1,200:1 | 600:1 |
| Base Sensitivity | 4,500:1 | 2,800:1 | 8,500:1 | 3,500:1 |
| Resolution | ||||
| Ex | 2.5 nm (at 546.1 nm) | 1.0 nm (at 546.1 nm) | 1.0 nm (at 546.1 nm) | 1.0 nm (at 546.1 nm) |
| Em | 2.5 nm (at 546.1 nm) | 1.0 nm (at 546.1 nm) | 1.0 nm (at 546.1 nm) | 2.0 nm (at 546.1 nm) |
| Band Width | ||||
| Ex | 2.5, 5, 10, 20 nm | 1, 2.5, 5, 10, 20 nm | 1, 2.5, 5, 10, 20, L5, L10 nm | 1, 2.5, 5, 10, 20, L5, L10 nm |
| Em | 2.5, 5, 10, 20 nm | 1, 2.5, 5, 10, 20 nm | 1, 2.5, 5, 10, 20, L5, L10 nm | 2.5, 10, 20, 40, L10, L20 nm |
| Wavelength Accuracy | ||||
| Ex | ±2.0 nm | ±1.5 nm | ±1.0 nm | ±1.0 nm |
| Em | ±2.0 nm | ±1.5 nm | ±1.0 nm | ±2.0 nm |
| Wavelength Repeatability | ||||
| Ex | ±1.5 nm | ±1.0 nm | ±0.3 nm | ±0.3 nm |
| Em | ±1.5 nm | ±1.0 nm | ±0.3 nm | ±0.6 nm |
| Wavelength Scan Speed | ||||
| Ex | 20, 50, 100, 200, 500, 1,000, 2,000, 5,000, 10,000, 20,000 nm/min | 20, 50, 100, 200, 500, 1,000, 2,000, 5,000, 10,000, 20,000 nm/min | 10, 20, 50, 100, 200, 500, 1,000, 2,000, 5,000, 10,000, 20,000, 60,000 nm/min | 10, 20, 50, 100, 200, 500, 1,000, 2,000, 5,000, 10,000, 20,000, 60,000 nm/min |
| Em | 20, 50, 100, 200, 500, 1,000, 2,000, 5,000, 10,000, 20,000 nm/min | 20, 50, 100, 200, 500, 1,000, 2,000, 5,000, 10,000, 20,000 nm/min | 10, 20, 50, 100, 200, 500, 1,000, 2,000, 5,000, 10,000, 20,000, 60,000 nm/min | 20, 50, 100, 200, 500, 1,000, 2,000, 5,000, 10,000, 20,000, 60,000, 120,000 nm/min |
| Slew Speed | ||||
| Ex | 30,000 nm/min | 30,000 nm/min | 60,000 nm/min | 60,000 nm/min |
| Em | 30,000 nm/min | 30,000 nm/min | 60,000 nm/min | 120,000 nm/min |
| Response | Ex: Silicon photodiode, Em: PMT | |||
| Photometric Range | -10,000 - 10,000 | |||
| Sensitivity Selection | High, Medium, Low, Very Low, Manual, Auto SCS | |||
| Auto Gain | Standard | |||
| Shutter Function | Standard (Automatic control) | |||
| Sample Illuminating System | Horizontal illumination | |||
| Sample Compartment | 10 mm rectangular cell holder, nitrogen purgeable | |||
| Recognition of IQ Accessory | Standard | |||
| Start Button | Standard | |||
| Analog Output | Standard | |||
| Instrument Communication | USB 2.0 | |||
| Control and Data Processing | Spectra Manager™/CFR, iRM | Spectra Manager™/CFR | ||
| Spectral Correction | Option | Option | Standard (Spectral correction using a Rhodamine B ethylene glycol solution is standard; other jigs for spectral correction are available separately as options.) | |
| Dimensions | 490(W) × 545(D) × 270(H) mm | 520(W) × 545(D) × 270(H) mm | 570(W) × 545(D) × 270(H) mm | 570(W) × 545(D) × 270(H) mm |
| Weight | 33.6 kg (74 lbs) | 36 kg (79 lbs) | 39 kg (86 lbs) | 39 kg (86 lbs) |
| Power Requirement | 270 VA | |||
| Installation Environment | Temperature: 15 to 35°C, Humidity: Less than 85% |
| Model | FP-8200 | FP-8300 | FP-8500 | FP-8600 |
|---|---|---|---|---|
| Data Station Type | Spectra Manager™/Spectra Manager™ CFR (Microsoft Windows® 7 or 8.1 Professional) | |||
| iRM Type | Handheld Intelligent Remote Module iRM-900 | N/A | ||
| Spectra Manager™ | Spectra measurement, Quantitative measurement | Spectra measurement,Quantitative measurement, Fixed wavelength measurement | ||
| Spectra Manager™ CFR | Fixed wavelength measurement, Time course measurement, 3-D Spectra measurement, Abs measurement | Time course measurement, 3-D Spectra measurement, Abs measurement, Phosphorescence measurement | ||
| iRM-900 | Spectra measurement, Quantitative measurement, Fixed wavelength measurement, Time course measurement, 3D Spectra measurement, Abs measurement | N/A | ||
| Spectra Correction Program | Standard | |||
| Instrument Validation | Program and Hg lamp (Standard), Accessories (option) | Program and Hg lamp (Standard), Accessories (Standard) | ||
| Self Diagnosis | Standard | |||
| IQ Accessory Recognition and IQ Start | Standard |
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