There are four distinct models in the FP-8000 Series, each offers an optimized solution for fluorescence and phosphorescence applications.
FP-8200 : For general use, especially for routine fluorescence analysis
FP-8300 : Versatile model with additional features for Bio applications
FP-8500 : Research model offering the ultimate performance
FP-8600 : Extended range NIR model for materials analysis research

• High throughput optical system
• Wide dynamic range for high sensitivity measurements (at least 6 orders of magnitude) using Auto Gain and Auto Sensitivity Control System for optimal S/N
• Variable spectral bandwidth down to 1 nm to resolve narrow spectral features
• Automatic band-pass filters for higher order diffraction
• High speed scanning for rapid data acquisition
• Spectral Correction for Quantum Yield measurements
• Expanded features for phosphorescence measurements (minimum lifetime measurement of 1 millisecond)

The high throughput optical system and low noise signal processing of the FP-8000 Series provides users with a high S/N (signal-to-noise) performance of up to 5,000:1 (RMS). The advanced A/D converter enables rapid sampling and the high speed signal processing system that immediately converts the fluorescence signal from the detector to a digital signal without introducing any additional noise.

A wide dynamic range for luminescence measurements is obtained by using the Auto-Gain and Auto-SCS features, automatically adjusting the detector gain and sensitivity for optimum measurements.

Auto-Gain automatically adjusts the gain of a signal from the detector, so that the S/N is optimized throughout the entire scan range for spectral or time course measurements. Since quantum yield measurements can produce peaks that vary greatly in fluorescence intensity, the auto-gain function assures the accuracy of the measurement.

The Auto Sensitivity Control System (SCS) allows users to create calibration curves for a wide concentration range without having to manually change the instrument Sensitivity settings. Auto-SCS can obtain measurements of sub-picomolar to micromolar concentrations for fixed wavelength measurements and quantitative analyses.

The conventional method for removing higher-order diffraction artifacts from excitation/emission spectra involves selection and installation of the proper cut filters according to the scanning wavelengths. The automatic cut filter system of the FP-8000 series (option for FP-8200) selects the proper cut-off filters for spectral measurements to obtain spectra without higher-order diffraction interference.

3D spectra measurement is available for all models of the FP-8000 series. The fastest scan speed of 60,000 nm/min for the FP-8500 offers 3D spectral measurement in the shortest time available for any instrument in this class. The analysis software offers a variety of processing methods to easily display the relevant data characteristics.

A high-speed chopper included with the FP-8300, 8500 and 8600 instruments enables phosphorescence spectrum measurements as well as advanced phosphorescent lifetime and quantitative analysis measurements.

Our comprehensive selection of over 50 sampling accessories for gas, liquid and solid samples ensures optimal performance across many sampling applications.

IQ accessory recognition uses a non-contact RFID sensor for automatic recognition by the instrument. Accessory information, including accessory name and serial number, is retrieved and saved in the spectral data file. The IQ Start function is used to automatically select a specified control program for simplified sample measurements.