The V-730 is a general-purpose double-beam spectrophotometer with a compact space-saving design. Its excellent spectroscopic performance is suitable for routine QC, teaching, and research applications.
User friendly features include IQ Accessory for automatic accessory recognition and IQ Start for quick start of routine measurements. The V-730 UV-visible/NIR spectrophotometer is operated by Spectra Manager II Suite, the latest innovative, cross-platform spectroscopy software or the iRM a handheld controller with color LCD touch screen. Both provide full system control and advanced data processing. Spectra Manager CFR (for 21 CFR part 11 compliance) is available as an option.
Both Spectra Manager™ and the iRM provide an intuitive interface allowing first time users to operate the instrument with ease.
The V-730 is compact with dimensions of only 441 (W) x 468 (D) x 216 (H) mm.
High-throughput optics and fast response detectors allow the V-730 to scan at speeds up to 8000 nm/min without wavelength tracking errors.
A wide range of sampling accessories include: autosamplers and sippers, cell holders, flow cells, temperature controllers and software applications.
The V-730 includes user-selectable validation to USP, EP and JP (or manually editable). With optional IQ/OQ.
Optical System | Rowland off-circle arrangement Single monochomator Double beam type |
Light source | Halogen lamp, Deuterium lamp |
Wavelength range | 190 to 1100 nm |
Wavelength accuracy | +/-0.2 nm (at 656.1 nm) |
Wavelength repeatability | +/-0.1 nm |
Spectral bandwidth (SBW) | 1 nm |
Stray light | 1 % (198 nm KCL 12 g/L aqueous solution) 0.02 % (220 nm NaI 10 g/L aqueous solution) 0.02 % (340 nm NaNO2 50 g/L aqueous solution) 0.02 % (370 nm NaNO2 50 g/L aqueous solution) SBW: 1 nm |
Photometric range | -3~3 Abs |
Photometric accuracy | +/-0.0015 Abs (0 to 0.5 Abs) +/-0.0025 Abs (0.5 to 1 Abs) +/-0.3 %T Tested with NIST SRM 930D |
Photometric repeatability | +/-0.0005 Abs (0 to 0.5 Abs) +/-0.0005 Abs (0.5 to 1 Abs) Tested with NIST SRM 930D |
Scanning speed | 10-8000 nm/min |
Slew speed | 24,000 nm/min |
RMS noise | 0.00004 Abs (0 Abs, wavelength: 500 nm, measurement time: 60 sec, SBW: 1 nm) |
Baseline stability | 0.0004 Abs/hour (Value obtained more than one hour after turning on the source, when the room temperature is stabilized, wavelength: 250 nm, response: slow) |
Baseline flatness | +/-0.0005 Abs (200 - 1000 nm |
Detector | Silicon photodiode |
Standard functions | IQ accessories, Start button, Analog output |
Standard programs | Abs/%T meter, Quantitative analysis, Spectrum measurement, Time course measurement, Fixed wavelength measurement, Validation, Daily maintenance, Two wavelength time course measurement |
Dimensions and weight | 486(W) x 441(D) x 216(H) mm, 15 kg |
Power requirements | 120 VA |
Installation requirements | Room temperature: 15-30 Celsius, humidity: below 85% |
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