The IRT-7000 includes up to two detectors as standard; a 16-channel linear array detector for infrared sample imaging and a single-point MCT detector. The combination of the standard automatic sample stage and IQ Mapping offers high-speed mapping analyses over a very large sample area, multi-area ATR mapping, and IR imaging with spatial resolution close to the diffraction limit with excellent sensitivity in a short time. In combination with the FT/IR-6000 with Rapid Scan or Step Scan options, this system offers advanced dynamic imaging as well as time-resolved measurements. For multivariate analysis, Principal Component Analysis (PCA) is included as standard.

• IQ Mapping for in-situ mapping experiments for high speed or samples that can be easily damaged when the ATR is moved
• Rapid IR Imaging experiments
• Up to four objectives with automatic switching
• Exceptional visual observation quality with DIC and polarization options
• Wide area mapping and multi-ATR imaging
• Dynamic Imaging with Rapid Scan and Step-Scan options
• Multivariate analysis PCA

Automatic Sample Stage with Mid-Band MCT Detector
The IRT-7100 automated FTIR microscope includes a standard mid-band MCT detector, with an option to simultaneously install up to two detectors. It is easily field-upgradable to an IR imaging system by adding an optional linear array detector. The standard automatic sample stage provides wide area mapping and multi-ATR mapping together with IQ Mapping.

• Fully automated sample stage with auto focus (standard)
• IQ Mapping
• Up to four objectives
• Dual detector capability (optional second detector and optional user-swappable detectors)
• Field upgrade to IR Imaging System using a linear array detector

Automatic Sample Stage, Mid-Band MCT Detector and 16 element Linear Array MCT Detector
The IRT-7200 Linear Array FTIR Imaging microscope includes two detectors as standard, a 16-channel linear array detector and a single-point mid-band MCT detector. The combination of the standard automatic sample stage and IQ Mapping allows mapping analyses of a larger sample area, multi-area ATR mapping, and IR imaging of a specified area with extremely high spatial resolution and excellent sensitivity in a short time.

• Full IR Imaging function
• IQ Mapping
• Up to four objectives
• Wide area mapping and multi-ATR imaging
• Dynamic Imaging with FTIR step-scan option
• Multivariate analysis PCA as standard

Spectra Manager™ provides automatic functions and simplified operation to minimize manual operation. Measurement conditions, microscope sample monitoring/control and measurement results can be viewed on a single screen. The microscope control  interface includes various types of measurements such as single and multi-point, mapping, and linear array measurements using a single mouse-click for mode selection. Real time monitoring of the spectrum and a calculated chemical image can be specified during the mapping measurement.

The Clear-View ATR objectives enable simultaneous sample viewing while preparing for ATR measurement and as the ATR crystal element contacts the sample. IQ Mapping can be used for automatic multi-point mapping, line mapping, grid mapping and IR Imaging analysis of a microscopic area even with a manual sample stage and a single element detector.
IQ Mapping coupled with a Clear-View ATR objective allows ATR mapping and ATR Imaging of any sample in contact with the ATR objective without moving the sample stage or ATR objective, while observing the entire area of the sample in contact with the crystal. This provides high-speed and cross-contaminant free measurements of a small sampling area.

For FTIR measurement, absorption peaks due to atmospheric water vapor and CO2 can make it difficult to obtain high quality sample spectra. The most effective solution to this problem is the measurement of samples in the vacuum. As a factory option, a vacuum type FTIR microscope system can be provided.