The SLM-907 specular reflectance accessory measures the relative reflectance of a sample in comparison with the reflected light from an aluminum-deposited plane mirror as a reference. This accessory is used for the reflectance measurement of sample types such as: metal-deposited films, metal plating, and other thin films. Film thickness can be calculated using the optional film thickness analysis program.
| Specifications | |
|---|---|
| Wavelength range | 250 to 1000 nm (V-730 UV/VIS spectrophotometer) 200 to 900 nm (V-750/760 UV/VIS spectrophotometer) 200 to 2700 nm (V-770 UV/VIS/NIR spectrophotometer) 200 to 1600 nm (V-780 UV-Vis/NIR spectrophotometer) |
| Sample size | Sample: Minimum 10 x 10 mm Maximum 100 x 120 mm Reference: Minimum 10 x 10 mm Maximum 20 x 20 mm |
| Beam port diameter | 7 mm (4 mm, 2 mm as option) |
| Angle of Incidence | Approx. 5° |
| Reflection reference | Aluminum-deposited plane mirror (Standard mirror) |
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